Non-contact measurement with ChromaLine sensor

MPLS-DM SERIES

Based on STIL's chromatic confocal technology, ChromaLine sensor family represents the next step in industrial integration.

Thanks to its accuracy, its robustness and a life span of several years without any maintenance, MPLS sensors are adapted to the requirements of on-line control.

DESCRIPTION
BENEFITS
TECH SPECS
APPLICATIONS
VERSIONS
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DESCRIPTION

With 180 measuring points aligned along a line ranging from 1 to 12 millimeters, the new MPLS-DM version enables high-quality inspection with new capabilities, and working frequencies up to 2kHz in standard mode, and even 6kHz with a reduced sensor measuring range.

BENEFITS

Versatile: measures any material capable of reflecting white light (e.g. metal, glass, plastic, paint films, liquids)
Industrial thanks to its optical head made exclusively of passive components
Up to 360,000 measured points/second allows to work in all industries in standard 2Klines/second
More than 1 million points/second are acquired on dedicated applications at 6Klines / second
Distance and thickness measurements
High measurement accuracy
Availability of SDK and protocol commands for easy integration into any system
Synchronized measurement with encoder for dynamic acquisitions
Ethernet communication

TECH SPECS

Controller	MPLS-DM
Technology	Chromatic Confocal
Source	White LED
Number of Points	180
Measuring Frequency	200 Hz - 2000 Hz (up to 6000 Hz decreasing MR)
Distance Measurement	Highest/First/Second/Third/Fourth/Last Peak
Thickness Measurement	2 of 5 peaks
Digital Output	GigaEthernet
Synchronization	Trigger in&out
Other Input/Output	Encoder Input (1)
Fiber Bundle Length	5 m
Temperature In Use	5°C - 50°C
Storage Temperature	-30°C - 70°C
Relative Humidity	5% - 80% HR without condensation
Protection Type	IP20
Compliance	EN 61010-1; EN 61326-1
Power Supply	100-240 Vac
Maximum/Usual Consumption	120 W/70 W
Dimensions (mm)	448,9 x 184 x 497
Weight	14,5 kg

Product	Unit	MPLS-DM NANOVIEW	MPLS-DM WIREVIEW	MPLS-DM MICROVIEW	MPLS-DM DEEPVIEW mk2	MPLS-DM SUPERVIEW
Order Code		OPSTM705002	OPSTM710002	OPSTM706002	OPST0707002	OPSTM711001
Line Length	mm	1.34	1.51	1.8	4.2	12.85
Measuring Range 2 kHz	mm	0.12	0.9	0.5	2.6	2
Working Distance	mm	7.4	7.8	10.1	19.5	11.3
Numerical Aperture		0.75	0.75	0.5	0.37	0.33
Max. Sample Slope	°	± 43	± 46	± 30	± 20	± 17
Pitch (dist. between 2 points)	µm	7.5	8.5	10.1	23.5	71.8
Max. Linearity Error	µm	± 0.04	± 0.1	± 0.08	± 0.12	± 0.12
Static Noise	nm	25	150	100	300	300
Axial Resolution	µm	0.15	0.9	0.6	1.8	1.8
Spot Size	µm	2.9	3.2	3.8	8.8	27.2
Homogeneity	nm	30	200	125	400	400
Min. Measurable Thickness	µm	18	110	50	250	300
Length Diameter Weight	mm mm g	436.1 50 2350	482.5 70 2850	427.3 50 2250	428.3 60 2800	397.8 60 2550
Measuring Range 4 kHz	mm	0.055*	0.45*	0.235*	1.15*	0.9*
Measuring Range 6 kHz	mm	0.030*	0.24*	0.12*	0.65*	0.5*

* Preliminary value

APPLICATIONS

The chromatic confocal technology of ChromaLine sensor is suitable for a variety of applications in many fields:

Automotive glass
Glass containers and packaging industry
Electrical vehicle industry (batteries)
Applications for measuring roll-to-roll, transparent and non-transparent films (e.g. EV battery covers, flexible electronics)
Electronics Industry (PCB)
Semiconductor industry (silicon wafer)
CCC industry
Medical
Micromechanics
Aviation/Aerospace
Watchmaking
Robotics

VERSIONS

ChromaLine sensors are available as standard in five versions: MPLS180DM NanoView, MicroView, WireView, DeepView and SuperView.

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BROCHURES AND MANUALS

	Brochure	Data Sheet
English	STIL - General Catalogue: (13.23MB)	MPLS-DM SERIES: (801.99kB)
Japanese	STIL - General Catalogue: (21.22MB)	-
Simplified Chinese	STIL - General Catalogue: (18.78MB)	-