MAINDO is a comprehensive solution for streamlined quality management through data centralization and real-time monitoring. Designed for flexibility, MAINDO is cloud-based but also offers an on-premise option for those with specific IT infrastructure needs. This adaptability enables manufacturers of any scale to integrate MAINDO with existing MES and ERP systems seamlessly.
Marposs focuses on the HVAC-R industry, developing the HeSNIFFER, a modular system that starts with a basic sniffing test, offering manual, portable detection of leaks using helium mass spectrometry. It can be upgraded with automated modules for higher productivity, including robotic sniffing probes and a vacuum leak test chamber. This flexible, step-by-step approach enhances production quality and accuracy while allowing customers to adapt the system to their specific needs.
Optoquick, already known for its precise optical snap capabilities and optional 3D touch probe, can now be equipped with a 3-axis Hall sensor. This advanced sensor allows us to measure the magnetic field intensity relative to the rotor's angular position, at varying distances from the magnets, and at different heights. The latest innovation applied to our Optoquick multi-sensor family is the possibility to combine dimensional measurements with magnetic field intensity analysis.
Marposs offers a complete testing service for fuel cell components, including leak testing of bipolar plates and a variety of other components. This service is tailored for customers in the early or prototype stages of development, allowing validation of concepts and technologies before scaling up to production, thereby reducing potential costly errors down the line.
Wafer testing is a critical step in semiconductor manufacturing, involving significant risks from both productivity and quality perspectives. This step not only finalizes the value creation chain in front-end-of-line (FEOL) processes but sometimes includes back-end-of-line (BEOL) processes, such as bumping. A loss of components or entire wafers during this stage can severely impact product capitalization. Moreover, the unnoticed damage during wafer tests can lead to costly product recalls, posing serious implications for manufacturers. Effective solutions are essential to mitigate these risks and enhance wafer test reliability.
Marposs offers a very wide range of solutions and applications for gear inspection by relying on decades of experience in this field. By providing sensors for machine monitoring, off-the-shelf solutions, and complex customized applications, Marposs positions itself as the perfect partner to help keep the entire gear manufacturing process under control. M62 Flex is one of the gear measuring instruments that Marposs is promoting to fit these requirements. It’s a standalone manual-use bench gauge for the inspection of some of the most traditional toothing parameters of gears: DOB (MdK), Root Diameter, and Tip Diameter.
E-mail
Password
Wrong email and/or password.
Please enter your email to reset your forgotten password and set a new one.
Unable to send recovery password email. Please try later.
The account information you entered is incorrect or could not be verified.
Your request has been sent successfully! The system will automatically send you an email to reset your password. You have to click the link in the email, to reset your password.
If you are not yet registered, you may do it now: it is free!Click here!
Receive news and updates about Marposs