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半導体製造用ダイシングマシンに変革をもたらすVBI Read

半導体製造用ダイシングマシンに変革をもたらすVBI - vbi-revolutionizing-dicing-machines-for-semiconductor-production

半導体業界では、精度が最も重要です。チップ製造においてウェーハダイシングプロセスは、シリコン、ガラス、サファイア、およびシリコンカーバイド (SiC) や窒化ガリウム (GaN) などの高度な化合物と繊細な材料を切断するため、極めて高い精度が求められます。この段階での小さな欠陥は、大きな生産損失につながる可能性があります。そこでマーポスは、革新的なソリューションであるビジュアルブレード検査システム(VBI：Visual Blade Inspector) を開発しました。この最先端センサーテクノロジーは、ダイシングマシンの動作を再定義し、より高い精度と信頼性を保証します。
MAINDO: Empowering Quality Management and Process Optimization in Manufacturing Read

MAINDO: Empowering Quality Management and Process Optimization in Manufacturing - maindo-empowering-quality-management-and-process-optimization-in-manufacturing

MAINDO is a comprehensive solution for streamlined quality management through data centralization and real-time monitoring. Designed for flexibility, MAINDO is cloud-based but also offers an on-premise option for those with specific IT infrastructure needs. This adaptability enables manufacturers of any scale to integrate MAINDO with existing MES and ERP systems seamlessly.

HeSNIFFER, the solution for in-line leak testing in the HVAC-R industry Read

HeSNIFFER, the solution for in-line leak testing in the HVAC-R industry - hesniffer-for-in-line-leak-testing-in-the-hvac-r-industry

Marposs focuses on the HVAC-R industry, developing the HeSNIFFER, a modular system that starts with a basic sniffing test, offering manual, portable detection of leaks using helium mass spectrometry. It can be upgraded with automated modules for higher productivity, including robotic sniffing probes and a vacuum leak test chamber. This flexible, step-by-step approach enhances production quality and accuracy while allowing customers to adapt the system to their specific needs.
Optoquick with Hall Sensor for Permanent Magnets Rotors Read

Optoquick with Hall Sensor for Permanent Magnets Rotors - optoquick-with-hall-sensor-for-permanent-magnets-rotors

Optoquick, already known for its precise optical snap capabilities and optional 3D touch probe, can now be equipped with a 3-axis Hall sensor. This advanced sensor allows us to measure the magnetic field intensity relative to the rotor's angular position, at varying distances from the magnets, and at different heights. The latest innovation applied to our Optoquick multi-sensor family is the possibility to combine dimensional measurements with magnetic field intensity analysis.

Marposs Testing Service for Fuel Cell Components Read

Marposs Testing Service for Fuel Cell Components - marposs-hetech-testing-service-for-fuel-cell-components

Marposs offers a complete testing service for fuel cell components, including leak testing of bipolar plates and a variety of other components. This service is tailored for customers in the early or prototype stages of development, allowing validation of concepts and technologies before scaling up to production, thereby reducing potential costly errors down the line.
Revolutionizing Wafer Test Processes: The AOP PCI Metrology and Inspection Solution Read

Revolutionizing Wafer Test Processes: The AOP PCI Metrology and Inspection Solution - revolutionizing-wafer-test-processes-the-aop-pci-metrology-and-inspection-solution

Wafer testing is a critical step in semiconductor manufacturing, involving significant risks from both productivity and quality perspectives. This step not only finalizes the value creation chain in front-end-of-line (FEOL) processes but sometimes includes back-end-of-line (BEOL) processes, such as bumping. A loss of components or entire wafers during this stage can severely impact product capitalization. Moreover, the unnoticed damage during wafer tests can lead to costly product recalls, posing serious implications for manufacturers. Effective solutions are essential to mitigate these risks and enhance wafer test reliability.
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