Film Width Measurement on R2R Process
In the field of electronic devices, Roll-to-Roll (R2R) processing is a method of producing flexible and large-area electronic devices on a roll of plastic film or metal foil.
R2R is a family of manufacturing techniques involving continuous processing of a flexible substrate that is transferred between two moving rolls of material in which additive processes can be used to build film structures in a continuous manner.
R2R is an important class of substrate-based manufacturing processes applied nowadays for EV market lithium-ion battery (LIB) such as:
- Metal foil (aluminium and copper) manufacturing
- Plastic film for separator production
- Printed/Flexible thin-film batteries electrodes (cathode and anode)
The current needs to apply R2R processes in flexible thin-film battery manufacturing are focused on the following process operation:
Rolling process (LIB electrode manufacturing)
- R2R Coating and Drying
- R2R Calendering or Compressing
- R2R Slitting or Cutting
In all these operations is important to reduce excessive scrap rates of electrode manufacturing by means an In-line quality measurement and control as example non-contact technology sensors for width checking.
The width checking must be performed strictly within the production line, therefore be carried out with non-contact technologies. In order to perform in-line measurement of the width on delicate material that can’t be touched and measured with traditional contact solution, MARPOSS/AEROEL proposed its own non-contact technologies that is Laser Scanner Micrometers.
- Scanning Motor with Fluid Dynamic Bearing Technology (without ball bearing) works perfectly, with no wear.
- NO-VAR active thermal compensation allows you to automatically compensate room temperature changes.
- Permanent self calibration and Excellent linearity
- Fully re-programmable with capability to store different application programs
- Direct connection to PC, PLC e NC
- Inputs for reading and synchronizing quadrature encoders
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Version |
XLS40 |
XLS80 |
XLS150 |
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Measuring Field |
40 mm |
80 mm |
150 mm |
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Measurable Width |
0,06 ÷ 38 mm |
0,75 ÷ 78 mm |
0,8 ÷ 149 mm |
|
Repeatability (T=1s, ±2σ) |
+/- 0,07 µm |
+/- 0,2 µm |
+/- 0,4 µm |
|
Scanning Frequency |
1.500 Hz |
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|
Laser Source |
VLD (Visible Laser Diode); λ = 650 nm |
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