Non contact thickness measurement

STIL chromatic confocal sensors are destinated to measure thicknesses without contact, by transparence or step height difference, in every environment such as in-line industries or in labs.
The principle consists in measuring the position of a diopter, ie the interface between 2 surfaces with a different refractive index, and simultaneously the position of another diopter. The difference between the 2 distance measurements indicates the optical thickness measurement, from which the mechanical thickness is deduced.
Measuring samples comprising several layers is possible using the same method: The multilayer software measurements is available on some STIL MARPOSS controllers.

VANTAGGI
DESCRIZIONE
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VANTAGGI

High Axial resolution : From nanometer scale (nm)
High Lateral resolution : From micrometer scale (µm)
Optical Heads only composed of passive components
High signal to noise ratio
Works on all types of samples
Wide choice of measuring ranges
Steep slope compatibility thanks to Maximum Numerical Aperture (NA)
Coaxial (no « shadowing »)
« Speckle » free

DESCRIZIONE

STIL MARPOSS Sensors are composed of several references, from 1 measurement point to multiple measurement points distributed along a line or within a field.
The ChromaPoint Optical Heads are interchangeable to warranty flexibility, reliability and adaptability in any kind of applications and on every surface reflectivity : transparent, opaque, diffusing, shiny.
For transparent sample as glass, the minimum thickness measurement is indicated within datasheet and specification in taking into account the path through a surface with refractive index n=1.5.
Similarly, the maximum thickness of transparent sample as glass is function of the refractive index.

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