arrow-left-2arrow-left-3arrow-left-4arrow-leftchronodiggdown-arrow--lineardown-arrowearthenvelopefacebookfacebook_ (2)facebook_forward-arrowforwardgooglehomeico-downloadico-linkindustries--1industries--10industries--10_oldindustries--2industries--3industries--4industries--5industries--6industries--6_oldindustries--7industries--8industries--9linkedinmailmarkernewspaperpadlockpage-arrow-leftpage-arrow-rightpage-listpencilpinterestplay-buttonprintersearchsocial-diggsocial-facebooksocial-googlesocial-instagramsocial-linkedinsocial-pinterestsocial-twittersocial-youtubestartelephonetwittertwitter_user

Non contact defects inspection

Vision systems have a double role: provide a good-quality image of the sample surface with the desired magnification and process the image in order to detect and analyze some predefined features or textures. 


While the processing units get more and more powerful, the basic limitation of current Vision systems resides in their very small depth of focus (a few dozens of µm or less, depending on the numerical aperture). Due to this limitation, expensive and complicated Z scanning systems and / or autofocus mechanism are required for viewing samples with larger Z extension and moving samples. 
 

 

Non contact defects inspection
BESCHREIBUNG

Chromatic confocal microscopy is a technology allowing the design of optical systems with a very large depth of focus (up to several mm). For samples located anywhere within the extended depth of focus view these system provide a sharp, high quality and perfectly focused image. 


This technology combines the merits of color coding and of traditional confocal microscopes. Chromatic confocal microscopes consist of a slit illuminated by a polychromatic light source, a high quality chromatic lens, a beam separator and a 4K line camera.​

NUTZEN
  • Large Depth of Field (DOF) : Millimeters DOF instead of 10th of µm for microscopes
  • Less/no focussing required
  • Focus on glass & mirror becomes possible
  • Resolution (X-Y) Pixel size on sample ≥ 0,43 µm*0.43µm 
  • High Speed up to 199.5 klines per second
  • Works on any material Metal (polished or rough), Glass, Ceramics, Plastics …
TECHNISCHE DATEN

Product

 

MC2

NanoView

MC2

WireView

MC2

MicroView

MC2

DeepView
 

mk2

MC2

SuperView

Order Code

 

OPSTM702002

OPSTM708002

OPSTM704002

OPSTM706002

OPSTM709002

Line Length

mm

1,34

1,51

1,8

4,2

12,85

Depth of field

µm

120

900

500

2600

2000

Working

distance

mm

7,4

7,8

10,1

19,5

11,3

Magnification

 

17,3

15,6

12,9

5,6

1,8

Numerical

aperture

 

0,75

0,75

0,5

0,37

0,33

Max. sample

slope

°

43

46

30

20

17

Pixel size on

the sample

µm

0,43

0,49

0,58

1,35

4,1

Optical part:

Length

mm

421,6

468

412,8

400,5

370

Optical Part:

Diameter

mm

50

70

50

60

60

Optical Part:

Weight

g

5300

5800

5200

5850

5600

Download

PROSPEKTE UND HANDBÜCHER

Prospekt
Englisch STIL - General catalogue: (13.23MB)
Japanisch STIL - General catalogue: (21.22MB)
Vereinfachtes Chinesisch STIL - General catalogue: (18.78MB)
Schließen
Schließen

Anfrage Informationen

Ihr Vorname
Ihr Nachname
Name des Unternehmens
Ihre E-Mail-Adresse

Um Ihre Nachricht direkt an die zuständige Abteilung weiterleiten zu können, wählen Sie in der folgenden Liste bitte ein Anwendungsgebiet aus.:

Ihre Nachricht

Bitte lesen Sie sich unsere Datenschutzerklärung, die wir gemäß der der Verordnung EU 679/2016 bereitstellen, aufmerksam durch..

Bitte stimmen Sie der Datenschutzrichtlinie zu.
Top Kontakt